Researchers have developed a new method that makes X-ray images even better: The resolution is higher and allows more precise inferences about the properties of materials. They moved the lens of an X-ray microscope and recorded a number of individual images to generate, with the help of computer algorithms, the actual picture. They have, for the first time ever, transferred the principle of so-called Fourier ptychography to X-ray measurements.
from Top Technology News -- ScienceDaily https://www.sciencedaily.com/releases/2019/02/190201142353.htm
from Top Technology News -- ScienceDaily https://www.sciencedaily.com/releases/2019/02/190201142353.htm
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